Thin film Al targets for a laser-plasma source of extreme ultraviolet radiation

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چکیده

Using a multilayer mirror spectrometer of the extreme ultraviolet (EUV) range, laser plasma emission spectra bulk aluminum in wavelength range 8.0-18.0 nm were studied. Testing thin film targets made and comparative measurements intensity EUV radiation with thickness 100 material target carried out. Keywords: SXR radiation, film, plasma.

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ژورنال

عنوان ژورنال: ?????? ??????????? ??????

سال: 2022

ISSN: ['0044-4642', '1726-748X']

DOI: https://doi.org/10.21883/tp.2022.08.54565.75-22